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Detección de índice de área foliar por firma espectral de cultivo de arroz | ||
| Published in: | Innovation in Education and Inclusion : Proceedings of the 16th LACCEI International Multi-Conference for Engineering, Education and Technology |  |
| Date of Conference: | July 18-20, 2018 | |
| Location of Conference: | Lima, Perú | |
| Authors: |
Jorge Serrano (Universidad Tecnólogica de Panamá, PA) Jose Jimenez (Universidad Tecnólogica de Panamá, PA) Jose Fabrega (Universidad Tecnólogica de Panamá, PA) Javier Sanchez Galan (Universidad Tecnólogica de Panamá, PA) Evelyn Quirós (Instituto de Investigación Agropecuaria de Panamá, PA) | |
| Full Paper: | #303 | |
Abstract:The objective of the study was to determine the lengths for the spectral detection of the leaf area index in rice cultivation. Field measurements were made with a spectroradiometer and field measurements of leaf area. From the analysis of the main components, the lengths with the greatest variation in time were obtained, resulting in the lengths 820.68, 479.53 and 731.28. Of which only 820.68 and 479.53 were significant for a regression model with r = 0.966 and values in their validation of r = 0.836 | ||